MUISE / CTI: Environmental threats and embedded electronics

The MUISE program, in collaboration with CTI, organizes this seminar focused on the impact of environmental threats on the design, development, and operation of embedded electronic systems.

The session will address the main environmental factors affecting electronics in demanding environments, as well as the design, validation, and protection strategies needed to guarantee the reliability and robustness of electronic systems in critical applications.

Audience

Master’s students, PhD candidates, and interested students in:

• Embedded electronics
• Critical and high-reliability systems
• Electronic engineering in extreme environments
• Design and validation of industrial systems